in Fig. 6.Рrounded down to the lower severity level. For example, when This method requires adjustment of the microscope stage toРusing Plate I-A, when a field falls between a 1 severity rating maximize an inclusion severity level. That is, the field of viewРand a 0.5 severity rating, it is counted as a 0.5. When a field is adjusted using the microscope stage controls, such thatРfalls between a 1.5 severity rating and a 1 severity rating, it is inclusions are moved inside the square mask in order to locateРcounted as a 1. the worst field. In practice, the rater is actually scanning theР 12.2.3 Move the microscope stage to reveal an adjacent field specimen and stopping only when a potential worst field ofРand repeat parison procedure. Continue this process each type and thickness is in view.Р 10
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