.91.942.42.12.01.81.82.0中线控制上界控制下界中线控制上界控制下界日期12.42.02.02.421.62.32.02.132.02.21.82.042.12.21.91.851.92.01.91.862.12.01.92.0合计2、2.22.02.02.01.92.012.10.40.70.40.40.20.22.32.32.22.12.01.91.81.71.00.80.60.40.2日期12345673、某半导体厂进行产品检验,每天抽取100个产品,经10天得到以下数据,试画出不合格品数pn控制图(保留2位小数)。第n天12345678910不合格品数4752534361解:取108642样本组号123456789104、某厂对产品质量进行检查,经过20天得到以下数据,试画出不合格品率p控制图(保留4位小数)。样品数630430808780703814822600709760差错数871266868115样品数81079881342818503581464807595差错数1179671084117解:样品数630430808780703814822600709760差错数871266868115不合格率p%1.271.631.490.770.850.980.731.331.550.66UCL%2.422.692.282.302.362.272.272.462.352.31LCL%000.02000.030.03000样品数81079881342818503581464807595差错数1179671084117不合格率p%1.360.881.111.430.861.991.380.861.361.18UCL%2.272.282.272.712.272.582.482.632.282.46LCL%0.030.020.0300.030000.020
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