JESD47I中文版

tructivequalificationtestsmaybeusedtopopulateotherqualificationtests.Devicesthathavebeenusedindestructivequalificationtestsmaynotbeusedinsubsequentqualificationstressesexceptforengineeringanalysis.Non-destructivequalificationtestsare:EarlyLifeFailureRate,ElectricalParametersAssessment,ExternalVisual,SystemSoftError,andPhysicalDimensions.用于非破坏性考核测试的器件可以继续用其他考核测试。除了工程分析之外,已用于破坏性考核测试的器件不得用于随后的压力测试。非破坏性考核测试包括:早期失效率,电气参数测试,外观检查,系统软失效和物理尺寸测试。3.6?Definitionofelectricaltestfailureafterstressing压力测试后电气失效定义Post-stresselectricalfailuresaredefinedasthosedevicesnotmeetingtheindividualdevicespecificationorothercriteriaspecifictotheenvironmentalstress.Ifthecauseoffailureisduetocausesunrelatedtothetestconditions,thefailureshallbediscounted.压力测试后的电气失效定义是指不符合器件电气参数规范或其他环境压力测试规范。如果失败的原因是与测试条件无关的情况造成的,则不记为失效。