loy that has a plane strain fracture toughness of and a yield strength of 1400 MPa (205,000 psi). The flaw size resolution limit of the flaw detection apparatus is 4.0 mm (0.16 in.). If the design stress is one half of the yield strength and the value of Y is 1.0, determine whether or not a critical flaw for this plate is subject to detection.Р SolutionР?This problem asks that we determine whether or not a critical flaw in a wide plate is subject to detection given the limit of the flaw detection apparatus (4.0 mm), the value of KIc , the design stress (sy/2 in which s y = 1400 MPa), and Y = 1.0. We first need pute the value of ac using Equation 8.7; thusРTherefore, the critical flaw is not subject to detection since this value of ac (3.9 mm) is less than the 4.0 mm resolution limit.Р?8.11
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